Overview Fast Testing Control

ARBIN-SSIS-Overview-Fast-Testing-Control

Table of Contents

简介

In the fast-paced world of battery testing, where precise data is crucial for innovation and quality control, ensuring data integrity and reliability is paramount.

Arbin, a pioneer in battery testing solutions, recognizes this critical need and has implemented a comprehensive suite of measures to protect data, maintain accuracy, and enhance the overall value of your battery testing operations.

Fast measuring refresh in firmware

Arbin's advanced firmware is designed to refresh current and voltage control values with exceptional precision, updating these parameters as frequently as every 1 millisecond.

This capability ensures that the control system can react instantaneously to any changes or requirements during testing, providing unparalleled accuracy and responsiveness.

ARBIN-SSIS-Fast measuring refresh in firmware i1
ARBIN-SSIS-Fast measuring refresh in firmware i2

Real time control value updated by third party input

Arbin's advanced testing systems feature real-time control value updates driven by third-party inputs, such as CTI (Computerized Test Instrumentation) and CAN (Controller Area Network).

This capability allows for seamless integration with external data sources and systems, enabling dynamic adjustments to control values based on real-time information

# CTI is provided by Arbin:
CTI can support huge amount of parallel control of channels on multiple MCUs and the average time of sending command is within 20ms.

 Rapid Test Switching

Our advanced testing system rigorously checks all step limits with a high-frequency interval no less than every 0.2 milliseconds

This meticulous monitoring ensures that any deviations or thresholds are detected and addressed with minimal delay.

ARBIN-SSIS- Rapid Test Switching

The picture is a screenshot of steps, and the switch overhead is within a millisecond.

Dynamic ODR (Output Data Rate of ADC)

ODR stands for Output Data Rate. In ADC configuration, several options are available for selection.

The higher the output data rate is set, the faster the ADC will sample the data, albeit with lower accuracy.

Conversely, setting a lower data rate results in higher accuracy but at a reduced sampling rate.

  • Arbin provides a feature that allows users to adjust the ODR in steps to fully accommodate their experimental needs.
  • The time it takes for the ADC to switch the ODR is 40us.
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